A multi-model deep learning framework for SEM-based defect detection in Perovskite thin films.
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| Title: | A multi-model deep learning framework for SEM-based defect detection in Perovskite thin films. |
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| Authors: | Ansari, Zulfikar Ali1 (AUTHOR) zulfikar.ansari@sitpune.edu.in, Soni, Sahil1 (AUTHOR), Fatima, Shahin2 (AUTHOR), Siddiqui, Shadab2 (AUTHOR), Prasad, P. Venkata Hari3 (AUTHOR) |
| Source: | Scientific Reports. 11/25/2025, Vol. 15 Issue 1, p1-16. 16p. |
| Database: | Academic Search Ultimate |
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