Bibliographic Details
| Title: |
Time-resolved non-contact THz diagnostics of impurity state in different sulfur-implanted/laser-annealed silicon samples. |
| Authors: |
Kudryashov, Sergey I.1,2 kudryashovsi@lebedev.ru, Podlesnykh, Ivan M.2 kudryashovsi@lebedev.ru, Dravin, Valery A.2, Kovalev, Michael S.1,2, Chizhov, Pavel A.3, Bulgakova, Vladislava V.3, Ushakov, Alexander A.3, Goncharov, Yury G.3, Krasin, George K.2, Kuzmin, Evgeny V.2, Bondarenko, Anastasiya G.2, Maslov, Pavel A.4, Orekhov, Nikita D.1,2,4 |
| Source: |
Journal of Chemical Physics. 4/7/2026, Vol. 164 Issue 13, p1-7. 7p. |
| Database: |
Academic Search Ultimate |
