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Time-resolved non-contact THz diagnostics of impurity state in different sulfur-implanted/laser-annealed silicon samples.

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Title: Time-resolved non-contact THz diagnostics of impurity state in different sulfur-implanted/laser-annealed silicon samples.
Authors: Kudryashov, Sergey I.1,2 kudryashovsi@lebedev.ru, Podlesnykh, Ivan M.2 kudryashovsi@lebedev.ru, Dravin, Valery A.2, Kovalev, Michael S.1,2, Chizhov, Pavel A.3, Bulgakova, Vladislava V.3, Ushakov, Alexander A.3, Goncharov, Yury G.3, Krasin, George K.2, Kuzmin, Evgeny V.2, Bondarenko, Anastasiya G.2, Maslov, Pavel A.4, Orekhov, Nikita D.1,2,4
Source: Journal of Chemical Physics. 4/7/2026, Vol. 164 Issue 13, p1-7. 7p.
Database: Academic Search Ultimate
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DbLabel: Academic Search Ultimate
An: 192814764
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  Data: Time-resolved non-contact THz diagnostics of impurity state in different sulfur-implanted/laser-annealed silicon samples.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Chemical+Physics%22">Journal of Chemical Physics</searchLink>. 4/7/2026, Vol. 164 Issue 13, p1-7. 7p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=192814764
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        Value: 10.1063/5.0304765
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      – Code: eng
        Text: English
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        PageCount: 7
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      – TitleFull: Time-resolved non-contact THz diagnostics of impurity state in different sulfur-implanted/laser-annealed silicon samples.
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              Text: 4/7/2026
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