Damage‐limited resolution for X‐ray and electron microscopy of organic specimens.
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| Title: | Damage‐limited resolution for X‐ray and electron microscopy of organic specimens. |
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| Authors: | Egerton, Ray F.1 (AUTHOR) regerton@ualberta.ca, Nave, Colin2 (AUTHOR) |
| Source: | Acta Crystallographica: Section D, Structural Biology. May2026, Vol. 82 Issue 5, p471-483. 13p. |
| Database: | Academic Search Ultimate |
| ISSN: | 09074449 |
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| DOI: | 10.1107/S2059798326002445 |
