APA (7th ed.) Citation

Egerton, R. F., & Nave, C. (2026). Damage‐limited resolution for X‐ray and electron microscopy of organic specimens. Acta Crystallographica: Section D, Structural Biology, 82(5), 471. https://doi.org/10.1107/S2059798326002445

Chicago Style (17th ed.) Citation

Egerton, Ray F., and Colin Nave. "Damage‐limited Resolution for X‐ray and Electron Microscopy of Organic Specimens." Acta Crystallographica: Section D, Structural Biology 82, no. 5 (2026): 471. https://doi.org/10.1107/S2059798326002445.

MLA (9th ed.) Citation

Egerton, Ray F., and Colin Nave. "Damage‐limited Resolution for X‐ray and Electron Microscopy of Organic Specimens." Acta Crystallographica: Section D, Structural Biology, vol. 82, no. 5, 2026, p. 471, https://doi.org/10.1107/S2059798326002445.