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Stochastic Characterization of MAC-Level Reliability and Reassociation Dynamics in IEEE 802.15.4 Networks for Smart Grid Applications.

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Bibliographic Details
Title:	Stochastic Characterization of MAC-Level Reliability and Reassociation Dynamics in IEEE 802.15.4 Networks for Smart Grid Applications.
Authors:	Del-Valle-Soto, Carolina¹ (AUTHOR) cvalle@up.edu.mx, Del-Puerto-Flores, José A.^1,2 (AUTHOR), Velázquez, Ramiro^2,3 (AUTHOR), Botero-Valencia, Juan Sebastián^3,4 (AUTHOR), Valdivia, Leonardo J.^1,5 (AUTHOR), Varela-Aldás, José^1,4 (AUTHOR), Visconti, Paolo^2,5 (AUTHOR)
Source:	Symmetry (20738994). Apr2026, Vol. 18 Issue 4, p653. 30p.
Database:	Academic Search Ultimate
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Description
ISSN:	20738994
DOI:	10.3390/sym18040653