APA (7th ed.) Citation

Del-Valle-Soto, C., Del-Puerto-Flores, J. A., Velázquez, R., Botero-Valencia, J. S., Valdivia, L. J., Varela-Aldás, J., & Visconti, P. (2026). Stochastic Characterization of MAC-Level Reliability and Reassociation Dynamics in IEEE 802.15.4 Networks for Smart Grid Applications. Symmetry (20738994), 18(4), 653. https://doi.org/10.3390/sym18040653

Chicago Style (17th ed.) Citation

Del-Valle-Soto, Carolina, José A. Del-Puerto-Flores, Ramiro Velázquez, Juan Sebastián Botero-Valencia, Leonardo J. Valdivia, José Varela-Aldás, and Paolo Visconti. "Stochastic Characterization of MAC-Level Reliability and Reassociation Dynamics in IEEE 802.15.4 Networks for Smart Grid Applications." Symmetry (20738994) 18, no. 4 (2026): 653. https://doi.org/10.3390/sym18040653.

MLA (9th ed.) Citation

Del-Valle-Soto, Carolina, et al. "Stochastic Characterization of MAC-Level Reliability and Reassociation Dynamics in IEEE 802.15.4 Networks for Smart Grid Applications." Symmetry (20738994), vol. 18, no. 4, 2026, p. 653, https://doi.org/10.3390/sym18040653.