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Stochastic Characterization of MAC-Level Reliability and Reassociation Dynamics in IEEE 802.15.4 Networks for Smart Grid Applications.

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Title: Stochastic Characterization of MAC-Level Reliability and Reassociation Dynamics in IEEE 802.15.4 Networks for Smart Grid Applications.
Authors: Del-Valle-Soto, Carolina1 (AUTHOR) cvalle@up.edu.mx, Del-Puerto-Flores, José A.1,2 (AUTHOR), Velázquez, Ramiro2,3 (AUTHOR), Botero-Valencia, Juan Sebastián3,4 (AUTHOR), Valdivia, Leonardo J.1,5 (AUTHOR), Varela-Aldás, José1,4 (AUTHOR), Visconti, Paolo2,5 (AUTHOR)
Source: Symmetry (20738994). Apr2026, Vol. 18 Issue 4, p653. 30p.
Database: Academic Search Ultimate
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  Data: Stochastic Characterization of MAC-Level Reliability and Reassociation Dynamics in IEEE 802.15.4 Networks for Smart Grid Applications.
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  Data: <searchLink fieldCode="JN" term="%22Symmetry+%2820738994%29%22">Symmetry (20738994)</searchLink>. Apr2026, Vol. 18 Issue 4, p653. 30p.
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        Value: 10.3390/sym18040653
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        Text: English
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      – TitleFull: Stochastic Characterization of MAC-Level Reliability and Reassociation Dynamics in IEEE 802.15.4 Networks for Smart Grid Applications.
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              Text: Apr2026
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              Y: 2026
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