Stochastic Characterization of MAC-Level Reliability and Reassociation Dynamics in IEEE 802.15.4 Networks for Smart Grid Applications.
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| Title: | Stochastic Characterization of MAC-Level Reliability and Reassociation Dynamics in IEEE 802.15.4 Networks for Smart Grid Applications. |
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| Authors: | Del-Valle-Soto, Carolina1 (AUTHOR) cvalle@up.edu.mx, Del-Puerto-Flores, José A.1,2 (AUTHOR), Velázquez, Ramiro2,3 (AUTHOR), Botero-Valencia, Juan Sebastián3,4 (AUTHOR), Valdivia, Leonardo J.1,5 (AUTHOR), Varela-Aldás, José1,4 (AUTHOR), Visconti, Paolo2,5 (AUTHOR) |
| Source: | Symmetry (20738994). Apr2026, Vol. 18 Issue 4, p653. 30p. |
| Database: | Academic Search Ultimate |
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