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Study of Dangling Bond States in Magnetron-Sputtered a-Si Thin Films via Parametrization Using a Single UV–Vis–NIR Transmittance Spectrum.

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Bibliographic Details
Title:	Study of Dangling Bond States in Magnetron-Sputtered a-Si Thin Films via Parametrization Using a Single UV–Vis–NIR Transmittance Spectrum.
Authors:	Minkov, Dorian¹ (AUTHOR) angelov@ecad.tu-sofia.bg, Angelov, George² (AUTHOR), Nikolov, Dimitar^2,3 (AUTHOR), Rusev, Rostislav^3,4 (AUTHOR), Blanco, Eduardo^4,5 (AUTHOR), Fernandez, Susana^5,6 (AUTHOR), Ballester, Manuel^1,6 (AUTHOR), Marquez, Emilio^2,4 (AUTHOR)
Source:	Molecules. May2026, Vol. 31 Issue 9, p1469. 20p.
Database:	Academic Search Ultimate
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Description
ISSN:	14203049
DOI:	10.3390/molecules31091469