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Peak shift in depth profiling: Unraveling the influence of film thickness and sputtered crater in glow discharge spectrometry depth profiles.

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Bibliographic Details
Title: Peak shift in depth profiling: Unraveling the influence of film thickness and sputtered crater in glow discharge spectrometry depth profiles.
Authors: Liu, Gong-Wen1 (AUTHOR), Cai, Yu-Xin1 (AUTHOR), Huang, Wei-Nan1 (AUTHOR), Guo, Rong-Rong2 (AUTHOR), Li, Yu3 (AUTHOR), Tang, Yu4 (AUTHOR), Lian, Song-You1 (AUTHOR) sylian1@stu.edu.cn, Wang, Jiang-Yong1,5 (AUTHOR) 15017214200@163.com
Source: Spectrochimica Acta Part B. Jul2026, Vol. 241, pN.PAG-N.PAG. 1p.
Database: Academic Search Ultimate
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