Traction Force Microscopy for Viscoelastic Substrates: A Semi‐Analytical Method.

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Bibliographic Details
Title:	Traction Force Microscopy for Viscoelastic Substrates: A Semi‐Analytical Method.
Authors:	Villacrosa‐Ribas, Adrià^1,2,3 (AUTHOR), Duffhues, Daniëlle C. A.^1,2 (AUTHOR), van den Bersselaar, Pim^1,2 (AUTHOR), Pragnere, Sarah^1,2 (AUTHOR), Groenen, Bart G. W.^1,2 (AUTHOR), Azevedo Gonzalez Oliva, Mariana^3,4 (AUTHOR), Ciccone, Giuseppe^3,4 (AUTHOR), Salmeron‐Sanchez, Manuel^3,4,5 (AUTHOR), Bouten, Carlijn V. C.^1,2 (AUTHOR), Muñoz, Jose J.^6,7,8 (AUTHOR), Conte, Vito^1,2 (AUTHOR) v.conte@tue.nl
Source:	Advanced Science. May2026, p1. 21p. 8 Illustrations.
Database:	Academic Search Ultimate

Description
ISSN:	21983844
DOI:	10.1002/advs.202522252