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Traction Force Microscopy for Viscoelastic Substrates: A Semi‐Analytical Method.

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Title: Traction Force Microscopy for Viscoelastic Substrates: A Semi‐Analytical Method.
Authors: Villacrosa‐Ribas, Adrià1,2,3 (AUTHOR), Duffhues, Daniëlle C. A.1,2 (AUTHOR), van den Bersselaar, Pim1,2 (AUTHOR), Pragnere, Sarah1,2 (AUTHOR), Groenen, Bart G. W.1,2 (AUTHOR), Azevedo Gonzalez Oliva, Mariana3,4 (AUTHOR), Ciccone, Giuseppe3,4 (AUTHOR), Salmeron‐Sanchez, Manuel3,4,5 (AUTHOR), Bouten, Carlijn V. C.1,2 (AUTHOR), Muñoz, Jose J.6,7,8 (AUTHOR), Conte, Vito1,2 (AUTHOR) v.conte@tue.nl
Source: Advanced Science. May2026, p1. 21p. 8 Illustrations.
Database: Academic Search Ultimate
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An: 194040341
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  Data: <searchLink fieldCode="JN" term="%22Advanced+Science%22">Advanced Science</searchLink>. May2026, p1. 21p. 8 Illustrations.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=194040341
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      – Type: doi
        Value: 10.1002/advs.202522252
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      – Code: eng
        Text: English
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        PageCount: 21
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      – TitleFull: Traction Force Microscopy for Viscoelastic Substrates: A Semi‐Analytical Method.
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            NameFull: Villacrosa‐Ribas, Adrià
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            – D: 28
              M: 05
              Text: May2026
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              Y: 2026
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