Scaling of Phase Change Memory Cell: Reducing Contact Size Beyond the Limit of Lithography.

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Bibliographic Details
Title: Scaling of Phase Change Memory Cell: Reducing Contact Size Beyond the Limit of Lithography.
Authors: Chen, Yuqing1,2 (AUTHOR), Wang, Ruobing1 (AUTHOR), Song, Sannian1 (AUTHOR), Song, Zhitang1 (AUTHOR) ztsong@mail.sim.ac.cn, Zhou, Xilin1 (AUTHOR) xilinzhou@mail.sim.ac.cn
Source: Physica Status Solidi - Rapid Research Letters. May2026, Vol. 20 Issue 5, p1-15. 15p.
Database: Academic Search Ultimate
Description
ISSN:18626254
DOI:10.1002/pssr.202500489