High‐Fidelity Dehydration and Low‐Artifact Scanning Electron Microscopy Measurement of DNA Self‐Assembled Nanopatterns.
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| Title: | High‐Fidelity Dehydration and Low‐Artifact Scanning Electron Microscopy Measurement of DNA Self‐Assembled Nanopatterns. |
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| Authors: | Dai, Ruoyu1 (AUTHOR), Lin, HuiLi1 (AUTHOR), Liu, Songnan2,3 (AUTHOR), Liang, Fan1,4 (AUTHOR), Lin, Li1 (AUTHOR), Sun, Wei5 (AUTHOR), Shen, Jie1 (AUTHOR) shenjie@pku.edu.cn |
| Source: | Small Structures. Feb2026, Vol. 7 Issue 2, p1-10. 10p. |
| Database: | Academic Search Ultimate |
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| ISSN: | 26884062 |
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| DOI: | 10.1002/sstr.202500687 |
