Improved Thermal Transient Testing of Wide Bandgap Devices with Extremely Low Channel Resistance †.
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| Title: | Improved Thermal Transient Testing of Wide Bandgap Devices with Extremely Low Channel Resistance †. |
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| Authors: | Ress, Sandor1,2 (AUTHOR), Farkas, Gabor2 (AUTHOR), Sarkany, Zoltan1,2 (AUTHOR), Rencz, Marta1,2 (AUTHOR) rencz.marta@vik.bme.hu |
| Source: | Energies (19961073). Jun2026, Vol. 19 Issue 11, p2678. 21p. |
| Database: | Academic Search Ultimate |
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| ISSN: | 19961073 |
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| DOI: | 10.3390/en19112678 |
