Electroresistance mechanism of memristive Cu2S thin films.

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Bibliographic Details
Title:	Electroresistance mechanism of memristive Cu2S thin films.
Authors:	Wang, Meiyan^1,2, Dong, Ruifeng^1,2, Zhu, Zukang^1,2, Wang, Zhengzhou^1,2, Qin, Lanhao³, Li, Yuan³ yuanli1@hust.edu.cn, Wu, Jinsong^1,2 wujs@whut.edu.cn
Source:	Fundamental Research. May2026, Vol. 6 Issue 3, p1801-1807. 7p.
Database:	Academic Search Ultimate

Description
ISSN:	20969457
DOI:	10.1016/j.fmre.2025.02.021