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Electroresistance mechanism of memristive Cu2S thin films.

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Title: Electroresistance mechanism of memristive Cu2S thin films.
Authors: Wang, Meiyan1,2, Dong, Ruifeng1,2, Zhu, Zukang1,2, Wang, Zhengzhou1,2, Qin, Lanhao3, Li, Yuan3 yuanli1@hust.edu.cn, Wu, Jinsong1,2 wujs@whut.edu.cn
Source: Fundamental Research. May2026, Vol. 6 Issue 3, p1801-1807. 7p.
Database: Academic Search Ultimate
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Header DbId: asn
DbLabel: Academic Search Ultimate
An: 194709558
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Electroresistance mechanism of memristive Cu<subscript>2</subscript>S thin films.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Wang%2C+Meiyan%22">Wang, Meiyan</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AR" term="%22Dong%2C+Ruifeng%22">Dong, Ruifeng</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AR" term="%22Zhu%2C+Zukang%22">Zhu, Zukang</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AR" term="%22Wang%2C+Zhengzhou%22">Wang, Zhengzhou</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AR" term="%22Qin%2C+Lanhao%22">Qin, Lanhao</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22Li%2C+Yuan%22">Li, Yuan</searchLink><relatesTo>3</relatesTo><i> yuanli1@hust.edu.cn</i><br /><searchLink fieldCode="AR" term="%22Wu%2C+Jinsong%22">Wu, Jinsong</searchLink><relatesTo>1,2</relatesTo><i> wujs@whut.edu.cn</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Fundamental+Research%22">Fundamental Research</searchLink>. May2026, Vol. 6 Issue 3, p1801-1807. 7p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=194709558
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1016/j.fmre.2025.02.021
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 7
        StartPage: 1801
    Titles:
      – TitleFull: Electroresistance mechanism of memristive Cu2S thin films.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Wang, Meiyan
      – PersonEntity:
          Name:
            NameFull: Dong, Ruifeng
      – PersonEntity:
          Name:
            NameFull: Zhu, Zukang
      – PersonEntity:
          Name:
            NameFull: Wang, Zhengzhou
      – PersonEntity:
          Name:
            NameFull: Qin, Lanhao
      – PersonEntity:
          Name:
            NameFull: Li, Yuan
      – PersonEntity:
          Name:
            NameFull: Wu, Jinsong
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 05
              Text: May2026
              Type: published
              Y: 2026
          Identifiers:
            – Type: issn-print
              Value: 20969457
          Numbering:
            – Type: volume
              Value: 6
            – Type: issue
              Value: 3
          Titles:
            – TitleFull: Fundamental Research
              Type: main
ResultId 1