Effects of die aspect ratio on mold flow and structural behaviour in wafer-level encapsulation process.

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Bibliographic Details
Title: Effects of die aspect ratio on mold flow and structural behaviour in wafer-level encapsulation process.
Authors: Othman, Ainnur Hanim1 (AUTHOR) ainnurhanim.othman@gmail.com, Qing, Ooi Teng1 (AUTHOR) ooitengqing@gmail.com, Abdul Aziz, Mohd Sharizal2 (AUTHOR) msharizal@usm.my, Ishak, Mohammad Hafifi Hafiz1 (AUTHOR) mhafifihafiz@usm.my, Nashrudin, Muhammad Naqib3 (AUTHOR) muhammad.naqib.nashrudin@intel.com, Azman, Muhammad Aqil2,3 (AUTHOR) muhammad.aqil.azman@intel.com
Source: International Journal of Advanced Manufacturing Technology. Jun2026, p1-18. 18p.
Database: Academic Search Ultimate
Description
ISSN:02683768
DOI:10.1007/s00170-026-18520-9