A Study on Condition-Based Maintenance for Wafer Table Edge Degradation in Photolithography Equipment.

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Title: A Study on Condition-Based Maintenance for Wafer Table Edge Degradation in Photolithography Equipment.
Authors: Joo, Kyunghwan1,2 (AUTHOR), Lee, Kwang Hoon2,3 (AUTHOR), Jeon, Jae Wook1,3 (AUTHOR) jwjeon@skku.edu
Source: Sensors (14248220). Jun2026, Vol. 26 Issue 12, p3650. 19p.
Database: Academic Search Ultimate
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  Data: A Study on Condition-Based Maintenance for Wafer Table Edge Degradation in Photolithography Equipment.
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  Data: <searchLink fieldCode="AR" term="%22Joo%2C+Kyunghwan%22">Joo, Kyunghwan</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Lee%2C+Kwang+Hoon%22">Lee, Kwang Hoon</searchLink><relatesTo>2,3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Jeon%2C+Jae+Wook%22">Jeon, Jae Wook</searchLink><relatesTo>1,3</relatesTo> (AUTHOR)<i> jwjeon@skku.edu</i>
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  Data: <searchLink fieldCode="JN" term="%22Sensors+%2814248220%29%22">Sensors (14248220)</searchLink>. Jun2026, Vol. 26 Issue 12, p3650. 19p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=194914049
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        Value: 10.3390/s26123650
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      – Code: eng
        Text: English
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      – TitleFull: A Study on Condition-Based Maintenance for Wafer Table Edge Degradation in Photolithography Equipment.
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            NameFull: Joo, Kyunghwan
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            NameFull: Lee, Kwang Hoon
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              Text: Jun2026
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