A Study on Condition-Based Maintenance for Wafer Table Edge Degradation in Photolithography Equipment.
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| Title: | A Study on Condition-Based Maintenance for Wafer Table Edge Degradation in Photolithography Equipment. |
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| Authors: | Joo, Kyunghwan1,2 (AUTHOR), Lee, Kwang Hoon2,3 (AUTHOR), Jeon, Jae Wook1,3 (AUTHOR) jwjeon@skku.edu |
| Source: | Sensors (14248220). Jun2026, Vol. 26 Issue 12, p3650. 19p. |
| Database: | Academic Search Ultimate |
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| FullText | Links: – Type: pdflink Text: Availability: 1 |
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| Header | DbId: asn DbLabel: Academic Search Ultimate An: 194914049 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: A Study on Condition-Based Maintenance for Wafer Table Edge Degradation in Photolithography Equipment. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Joo%2C+Kyunghwan%22">Joo, Kyunghwan</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Lee%2C+Kwang+Hoon%22">Lee, Kwang Hoon</searchLink><relatesTo>2,3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Jeon%2C+Jae+Wook%22">Jeon, Jae Wook</searchLink><relatesTo>1,3</relatesTo> (AUTHOR)<i> jwjeon@skku.edu</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Sensors+%2814248220%29%22">Sensors (14248220)</searchLink>. Jun2026, Vol. 26 Issue 12, p3650. 19p. |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=194914049 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.3390/s26123650 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 19 StartPage: 3650 Titles: – TitleFull: A Study on Condition-Based Maintenance for Wafer Table Edge Degradation in Photolithography Equipment. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Joo, Kyunghwan – PersonEntity: Name: NameFull: Lee, Kwang Hoon – PersonEntity: Name: NameFull: Jeon, Jae Wook IsPartOfRelationships: – BibEntity: Dates: – D: 15 M: 06 Text: Jun2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 14248220 Numbering: – Type: volume Value: 26 – Type: issue Value: 12 Titles: – TitleFull: Sensors (14248220) Type: main |
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