Interconnect Reliability Investigation for a High‐Integration Dual‐Channel Receiver Front End.
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| Title: | Interconnect Reliability Investigation for a High‐Integration Dual‐Channel Receiver Front End. |
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| Authors: | Lin, Qian1 (AUTHOR) abgott@126.com, Zhang, Bo‐Hao1 (AUTHOR), Zhao, Peng‐Fei2 (AUTHOR), Tong, Wei2 (AUTHOR), Wang, Ce‐Tian2 (AUTHOR), Wu, Hai‐Feng2 (AUTHOR) linqian@tju.edu.cn |
| Source: | International Journal of Circuit Theory & Applications. Jul2026, p1. 11p. 21 Illustrations. |
| Database: | Academic Search Ultimate |
| ISSN: | 00989886 |
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| DOI: | 10.1002/cta.70526 |
