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Interconnect Reliability Investigation for a High‐Integration Dual‐Channel Receiver Front End.

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Title: Interconnect Reliability Investigation for a High‐Integration Dual‐Channel Receiver Front End.
Authors: Lin, Qian1 (AUTHOR) abgott@126.com, Zhang, Bo‐Hao1 (AUTHOR), Zhao, Peng‐Fei2 (AUTHOR), Tong, Wei2 (AUTHOR), Wang, Ce‐Tian2 (AUTHOR), Wu, Hai‐Feng2 (AUTHOR) linqian@tju.edu.cn
Source: International Journal of Circuit Theory & Applications. Jul2026, p1. 11p. 21 Illustrations.
Database: Academic Search Ultimate
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Header DbId: asn
DbLabel: Academic Search Ultimate
An: 195175023
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Interconnect Reliability Investigation for a High‐Integration Dual‐Channel Receiver Front End.
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  Data: <searchLink fieldCode="AR" term="%22Lin%2C+Qian%22">Lin, Qian</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> abgott@126.com</i><br /><searchLink fieldCode="AR" term="%22Zhang%2C+Bo‐Hao%22">Zhang, Bo‐Hao</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Zhao%2C+Peng‐Fei%22">Zhao, Peng‐Fei</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Tong%2C+Wei%22">Tong, Wei</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Wang%2C+Ce‐Tian%22">Wang, Ce‐Tian</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Wu%2C+Hai‐Feng%22">Wu, Hai‐Feng</searchLink><relatesTo>2</relatesTo> (AUTHOR)<i> linqian@tju.edu.cn</i>
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  Data: <searchLink fieldCode="JN" term="%22International+Journal+of+Circuit+Theory+%26+Applications%22">International Journal of Circuit Theory & Applications</searchLink>. Jul2026, p1. 11p. 21 Illustrations.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=195175023
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1002/cta.70526
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      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 11
        StartPage: 1
    Titles:
      – TitleFull: Interconnect Reliability Investigation for a High‐Integration Dual‐Channel Receiver Front End.
        Type: main
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      – PersonEntity:
          Name:
            NameFull: Lin, Qian
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          Name:
            NameFull: Zhang, Bo‐Hao
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            NameFull: Zhao, Peng‐Fei
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            NameFull: Tong, Wei
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          Name:
            NameFull: Wang, Ce‐Tian
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            NameFull: Wu, Hai‐Feng
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          Dates:
            – D: 09
              M: 07
              Text: Jul2026
              Type: published
              Y: 2026
          Identifiers:
            – Type: issn-print
              Value: 00989886
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            – TitleFull: International Journal of Circuit Theory & Applications
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