Voltage fluctuation of CMOS NAND gate analysed with large deviations theory.
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| Title: | Voltage fluctuation of CMOS NAND gate analysed with large deviations theory. |
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| Authors: | Yoshino, Daigo1 (AUTHOR), Tokura, Yasuhiro1 (AUTHOR) tokura.yasuhiro.ft@u.tsukuba.ac.jp |
| Source: | European Physical Journal: Special Topics. Jul2026, Vol. 235 Issue 11, p2819-2824. 6p. |
| Database: | Academic Search Ultimate |
| ISSN: | 19516355 |
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| DOI: | 10.1140/epjs/s11734-025-01790-x |
