An induction heating system for in situ X‐ray diffraction imaging: design, simulation and application to dislocation dynamics in semiconductors.

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Bibliographic Details
Title: An induction heating system for in situ X‐ray diffraction imaging: design, simulation and application to dislocation dynamics in semiconductors.
Authors: Kabukcuoglu, Merve P.1,2 (AUTHOR) merve.kabukcuoglu@kit.edu, Sagias, Nikolaos1 (AUTHOR), Hamann, Elias2 (AUTHOR), Richter, Carsten1 (AUTHOR), Zuber, Marcus2 (AUTHOR), Dadzis, Kaspars1,3 (AUTHOR) dadzis@etp.uni-hannover.de, Hänschke, Daniel2 (AUTHOR)
Source: Journal of Synchrotron Radiation. Jul2026, Vol. 33 Issue 4, p1126-1142. 17p.
Database: Academic Search Ultimate
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ISSN:09090495
DOI:10.1107/S1600577526004728