Extended Multi-Region Hamming-based ECC for Mitigating Clustered Faults in 3D Memories.
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| Title: | Extended Multi-Region Hamming-based ECC for Mitigating Clustered Faults in 3D Memories. |
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| Authors: | Kannan, Akshith1 (AUTHOR) akshithkannan37@gmail.com, Ariba, Hafsa1 (AUTHOR) hafsaariba1234@gmail.com, B M, Hitha1 (AUTHOR) bmhitha@gmail.com, Padmanaban Kamali, Jyotsna1 (AUTHOR) jyotsna.pk28@gmail.com, M S, Sunita1 (AUTHOR) sunitha@pes.edu |
| Source: | Journal of Electronic Testing. Jun2026, Vol. 42 Issue 3, p297-312. 16p. |
| Database: | Academic Search Ultimate |
| ISSN: | 09238174 |
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| DOI: | 10.1007/s10836-026-06236-3 |
