APA (7th ed.) Citation

Kannan, A., Ariba, H., B M, H., Padmanaban Kamali, J., & M S, S. (2026). Extended Multi-Region Hamming-based ECC for Mitigating Clustered Faults in 3D Memories. Journal of Electronic Testing, 42(3), 297. https://doi.org/10.1007/s10836-026-06236-3

Chicago Style (17th ed.) Citation

Kannan, Akshith, Hafsa Ariba, Hitha B M, Jyotsna Padmanaban Kamali, and Sunita M S. "Extended Multi-Region Hamming-based ECC for Mitigating Clustered Faults in 3D Memories." Journal of Electronic Testing 42, no. 3 (2026): 297. https://doi.org/10.1007/s10836-026-06236-3.

MLA (9th ed.) Citation

Kannan, Akshith, et al. "Extended Multi-Region Hamming-based ECC for Mitigating Clustered Faults in 3D Memories." Journal of Electronic Testing, vol. 42, no. 3, 2026, p. 297, https://doi.org/10.1007/s10836-026-06236-3.