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Extended Multi-Region Hamming-based ECC for Mitigating Clustered Faults in 3D Memories.

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Title: Extended Multi-Region Hamming-based ECC for Mitigating Clustered Faults in 3D Memories.
Authors: Kannan, Akshith1 (AUTHOR) akshithkannan37@gmail.com, Ariba, Hafsa1 (AUTHOR) hafsaariba1234@gmail.com, B M, Hitha1 (AUTHOR) bmhitha@gmail.com, Padmanaban Kamali, Jyotsna1 (AUTHOR) jyotsna.pk28@gmail.com, M S, Sunita1 (AUTHOR) sunitha@pes.edu
Source: Journal of Electronic Testing. Jun2026, Vol. 42 Issue 3, p297-312. 16p.
Database: Academic Search Ultimate
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An: 195343121
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  Data: Extended Multi-Region Hamming-based ECC for Mitigating Clustered Faults in 3D Memories.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Electronic+Testing%22">Journal of Electronic Testing</searchLink>. Jun2026, Vol. 42 Issue 3, p297-312. 16p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=195343121
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        Value: 10.1007/s10836-026-06236-3
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      – Code: eng
        Text: English
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        StartPage: 297
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      – TitleFull: Extended Multi-Region Hamming-based ECC for Mitigating Clustered Faults in 3D Memories.
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            NameFull: Kannan, Akshith
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              M: 06
              Text: Jun2026
              Type: published
              Y: 2026
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              Value: 42
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