View in EDS HTML Full Text PDF Full Text

Coupled Bayesian Identification of Residual Stress and Fracture Strength in Thin-Film Fragmentation: A Physics-Informed Neural Network Framework with Synthetic Validation of Interface Adhesion Energy.

Saved in:

Bibliographic Details
Title:	Coupled Bayesian Identification of Residual Stress and Fracture Strength in Thin-Film Fragmentation: A Physics-Informed Neural Network Framework with Synthetic Validation of Interface Adhesion Energy.
Authors:	Li, Jun¹ (AUTHOR), Li, Linan² (AUTHOR), Wang, Zhiyong^2,3 (AUTHOR), Li, Chuanwei^1,2 (AUTHOR), Wang, Shibin² (AUTHOR), Kang, Kai³ (AUTHOR)
Source:	Materials (1996-1944). Jul2026, Vol. 19 Issue 13, p2824. 17p.
Database:	Academic Search Ultimate
Full text is not displayed to guests. Login for full access.

Description
ISSN:	19961944
DOI:	10.3390/ma19132824