APA (7th ed.) Citation

Li, J., Li, L., Wang, Z., Li, C., Wang, S., & Kang, K. (2026). Coupled Bayesian Identification of Residual Stress and Fracture Strength in Thin-Film Fragmentation: A Physics-Informed Neural Network Framework with Synthetic Validation of Interface Adhesion Energy. Materials (1996-1944), 19(13), 2824. https://doi.org/10.3390/ma19132824

Chicago Style (17th ed.) Citation

Li, Jun, Linan Li, Zhiyong Wang, Chuanwei Li, Shibin Wang, and Kai Kang. "Coupled Bayesian Identification of Residual Stress and Fracture Strength in Thin-Film Fragmentation: A Physics-Informed Neural Network Framework with Synthetic Validation of Interface Adhesion Energy." Materials (1996-1944) 19, no. 13 (2026): 2824. https://doi.org/10.3390/ma19132824.

MLA (9th ed.) Citation

Li, Jun, et al. "Coupled Bayesian Identification of Residual Stress and Fracture Strength in Thin-Film Fragmentation: A Physics-Informed Neural Network Framework with Synthetic Validation of Interface Adhesion Energy." Materials (1996-1944), vol. 19, no. 13, 2026, p. 2824, https://doi.org/10.3390/ma19132824.