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Measurement System R&R Analysis for Zero-Inflated Correlated Defect Counts in Semiconductor Wafer AOI Inspection.

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Bibliographic Details
Title: Measurement System R&R Analysis for Zero-Inflated Correlated Defect Counts in Semiconductor Wafer AOI Inspection.
Authors: Fang, Chih-Chiang1 (AUTHOR), Chen, Ming-Nan2 (AUTHOR) t46111024@gs.ncku.edu.tw
Source: Mathematics (2227-7390). Jul2026, Vol. 14 Issue 13, p2355. 36p.
Database: Academic Search Ultimate
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ISSN:22277390
DOI:10.3390/math14132355