APA (7th ed.) Citation

Fang, C., & Chen, M. (2026). Measurement System R&R Analysis for Zero-Inflated Correlated Defect Counts in Semiconductor Wafer AOI Inspection. Mathematics (2227-7390), 14(13), 2355. https://doi.org/10.3390/math14132355

Chicago Style (17th ed.) Citation

Fang, Chih-Chiang, and Ming-Nan Chen. "Measurement System R&R Analysis for Zero-Inflated Correlated Defect Counts in Semiconductor Wafer AOI Inspection." Mathematics (2227-7390) 14, no. 13 (2026): 2355. https://doi.org/10.3390/math14132355.

MLA (9th ed.) Citation

Fang, Chih-Chiang, and Ming-Nan Chen. "Measurement System R&R Analysis for Zero-Inflated Correlated Defect Counts in Semiconductor Wafer AOI Inspection." Mathematics (2227-7390), vol. 14, no. 13, 2026, p. 2355, https://doi.org/10.3390/math14132355.