Measurement System R&R Analysis for Zero-Inflated Correlated Defect Counts in Semiconductor Wafer AOI Inspection.
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| Title: | Measurement System R&R Analysis for Zero-Inflated Correlated Defect Counts in Semiconductor Wafer AOI Inspection. |
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| Authors: | Fang, Chih-Chiang1 (AUTHOR), Chen, Ming-Nan2 (AUTHOR) t46111024@gs.ncku.edu.tw |
| Source: | Mathematics (2227-7390). Jul2026, Vol. 14 Issue 13, p2355. 36p. |
| Database: | Academic Search Ultimate |
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