Residual strain measurements in InGaAs metamorphic buffer layers on GaAs.

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Bibliographic Details
Title: Residual strain measurements in InGaAs metamorphic buffer layers on GaAs.
Authors: Bellani, V.1 bellani@unipv.it, Bocchi, C.2, Ciabattoni, T.1, Franchi, S.2, Frigeri, P.2, Galinetto, P.1, Geddo, M.3, Germini, F.2, Guizzetti, G.1, Nasi, L.2, Patrini, M.1, Seravalli, L.2, Trevisi, G.2
Source: European Physical Journal B: Condensed Matter. Apr2007, Vol. 56 Issue 3, p217-222. 6p. 3 Graphs.
Database: Academic Search Ultimate
Description
ISSN:14346028
DOI:10.1140/epjb/e2007-00105-8