Slow positron beams—a versatile tool for studying ion implantation defect related phenomena.

Saved in:
Bibliographic Details
Title: Slow positron beams—a versatile tool for studying ion implantation defect related phenomena.
Authors: Sealy, B. J., Knights, A. P., Gwilliam, R. M., Burrows, C. P., Coleman, P. G.
Source: AIP Conference Proceedings. 2001, Vol. 576 Issue 1, p745. 4p.
Database: Academic Search Ultimate
Description
ISSN:0094243X
DOI:10.1063/1.1395414