Reliability Testing of Advanced Interconnect Materials.
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| Title: | Reliability Testing of Advanced Interconnect Materials. |
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| Authors: | Keller, R. R.1, Strus, M. C.1, Chiaramonti, A. N.1, Kim, Y. L.2, Jung, Y. J.3, Read, D. T.1 |
| Source: | AIP Conference Proceedings. 11/15/2011, Vol. 1395 Issue 1, p259-263. 5p. |
| Database: | Academic Search Ultimate |
| ISSN: | 0094243X |
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| DOI: | 10.1063/1.3657900 |
