APA (7th ed.) Citation

Keller, R. R., Strus, M. C., Chiaramonti, A. N., Kim, Y. L., Jung, Y. J., & Read, D. T. (2011). Reliability Testing of Advanced Interconnect Materials. AIP Conference Proceedings, 1395(1), 259. https://doi.org/10.1063/1.3657900

Chicago Style (17th ed.) Citation

Keller, R. R., M. C. Strus, A. N. Chiaramonti, Y. L. Kim, Y. J. Jung, and D. T. Read. "Reliability Testing of Advanced Interconnect Materials." AIP Conference Proceedings 1395, no. 1 (2011): 259. https://doi.org/10.1063/1.3657900.

MLA (9th ed.) Citation

Keller, R. R., et al. "Reliability Testing of Advanced Interconnect Materials." AIP Conference Proceedings, vol. 1395, no. 1, 2011, p. 259, https://doi.org/10.1063/1.3657900.