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Reliability Testing of Advanced Interconnect Materials.

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Title: Reliability Testing of Advanced Interconnect Materials.
Authors: Keller, R. R.1, Strus, M. C.1, Chiaramonti, A. N.1, Kim, Y. L.2, Jung, Y. J.3, Read, D. T.1
Source: AIP Conference Proceedings. 11/15/2011, Vol. 1395 Issue 1, p259-263. 5p.
Database: Academic Search Ultimate
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DbLabel: Academic Search Ultimate
An: 67195417
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PubType: Conference
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  Data: <searchLink fieldCode="JN" term="%22AIP+Conference+Proceedings%22">AIP Conference Proceedings</searchLink>. 11/15/2011, Vol. 1395 Issue 1, p259-263. 5p.
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        Value: 10.1063/1.3657900
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              Text: 11/15/2011
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