Defect structure of epitaxial GaN films determined by transmission electron microscopy and triple-axis X-ray diffractometry.
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| Title: | Defect structure of epitaxial GaN films determined by transmission electron microscopy and triple-axis X-ray diffractometry. |
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| Authors: | Metzger, T., Hopler, R., Born, E., Ambacher, O., Stutzmann, M., Stommer, R., Schuster, M., Gobel, H., Christiansen, S., Albrecht, M., Strunk, H. P. |
| Source: | Philosophical Magazine A. Apr98, Vol. 77 Issue 4, p1013-1025. 13p. |
| Database: | Academic Search Ultimate |
| ISSN: | 01418610 |
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| DOI: | 10.1080/01418619808221225 |
