APA (7th ed.) Citation

Metzger, T., Hopler, R., Born, E., Ambacher, O., Stutzmann, M., Stommer, R., . . . Strunk, H. P. (1998). Defect structure of epitaxial GaN films determined by transmission electron microscopy and triple-axis X-ray diffractometry. Philosophical Magazine A, 77(4), 1013. https://doi.org/10.1080/01418619808221225

Chicago Style (17th ed.) Citation

Metzger, T., et al. "Defect Structure of Epitaxial GaN Films Determined by Transmission Electron Microscopy and Triple-axis X-ray Diffractometry." Philosophical Magazine A 77, no. 4 (1998): 1013. https://doi.org/10.1080/01418619808221225.

MLA (9th ed.) Citation

Metzger, T., et al. "Defect Structure of Epitaxial GaN Films Determined by Transmission Electron Microscopy and Triple-axis X-ray Diffractometry." Philosophical Magazine A, vol. 77, no. 4, 1998, p. 1013, https://doi.org/10.1080/01418619808221225.