Electrical quality of low-temperature (Tdep≤800 °C) epitaxial silicon: The effect of deposition temperature.
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| Title: | Electrical quality of low-temperature (Tdep≤800 °C) epitaxial silicon: The effect of deposition temperature. |
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| Authors: | Burger, W. R., Reif, R. |
| Source: | Journal of Applied Physics. 1/15/1988, Vol. 63 Issue 2, p368. 15p. |
| Database: | Academic Search Ultimate |
| FullText | Text: Availability: 0 |
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| Header | DbId: asn DbLabel: Academic Search Ultimate An: 7653747 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Electrical quality of low-temperature (Tdep≤800 °C) epitaxial silicon: The effect of deposition temperature. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Burger%2C+W%2E+R%2E%22">Burger, W. R.</searchLink><br /><searchLink fieldCode="AR" term="%22Reif%2C+R%2E%22">Reif, R.</searchLink> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>. 1/15/1988, Vol. 63 Issue 2, p368. 15p. |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=7653747 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1063/1.340248 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 15 StartPage: 368 Titles: – TitleFull: Electrical quality of low-temperature (Tdep≤800 °C) epitaxial silicon: The effect of deposition temperature. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Burger, W. R. – PersonEntity: Name: NameFull: Reif, R. IsPartOfRelationships: – BibEntity: Dates: – D: 15 M: 01 Text: 1/15/1988 Type: published Y: 1988 Identifiers: – Type: issn-print Value: 00218979 Numbering: – Type: volume Value: 63 – Type: issue Value: 2 Titles: – TitleFull: Journal of Applied Physics Type: main |
| ResultId | 1 |