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Sensitivity in X-ray grating interferometry on compact systems.

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Bibliographic Details
Title:	Sensitivity in X-ray grating interferometry on compact systems.
Authors:	Thuering, Thomas¹, Modregger, Peter², Hämmerle, Stefan³, Weiss, Stephan³, Nüesch, Joachim³, Stampanoni, Marco¹
Source:	AIP Conference Proceedings. 7/31/2012, Vol. 1466 Issue 1, p293-298. 6p. 1 Diagram, 1 Chart.
Database:	Academic Search Ultimate

Description
ISSN:	0094243X
DOI:	10.1063/1.4742307