APA (7th ed.) Citation

Thuering, T., Modregger, P., Hämmerle, S., Weiss, S., Nüesch, J., & Stampanoni, M. (2012). Sensitivity in X-ray grating interferometry on compact systems. AIP Conference Proceedings, 1466(1), 293. https://doi.org/10.1063/1.4742307

Chicago Style (17th ed.) Citation

Thuering, Thomas, Peter Modregger, Stefan Hämmerle, Stephan Weiss, Joachim Nüesch, and Marco Stampanoni. "Sensitivity in X-ray Grating Interferometry on Compact Systems." AIP Conference Proceedings 1466, no. 1 (2012): 293. https://doi.org/10.1063/1.4742307.

MLA (9th ed.) Citation

Thuering, Thomas, et al. "Sensitivity in X-ray Grating Interferometry on Compact Systems." AIP Conference Proceedings, vol. 1466, no. 1, 2012, p. 293, https://doi.org/10.1063/1.4742307.