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Sensitivity in X-ray grating interferometry on compact systems.

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Title: Sensitivity in X-ray grating interferometry on compact systems.
Authors: Thuering, Thomas1, Modregger, Peter2, Hämmerle, Stefan3, Weiss, Stephan3, Nüesch, Joachim3, Stampanoni, Marco1
Source: AIP Conference Proceedings. 7/31/2012, Vol. 1466 Issue 1, p293-298. 6p. 1 Diagram, 1 Chart.
Database: Academic Search Ultimate
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PubType: Conference
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  Data: <searchLink fieldCode="JN" term="%22AIP+Conference+Proceedings%22">AIP Conference Proceedings</searchLink>. 7/31/2012, Vol. 1466 Issue 1, p293-298. 6p. 1 Diagram, 1 Chart.
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        Value: 10.1063/1.4742307
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        Text: English
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      – TitleFull: Sensitivity in X-ray grating interferometry on compact systems.
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              Text: 7/31/2012
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