Advantages of a synchrotron bending magnet as the sample illuminator for a wide-field X-ray microscope.

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Bibliographic Details
Title: Advantages of a synchrotron bending magnet as the sample illuminator for a wide-field X-ray microscope.
Authors: Feser, M., Howells, M. R., Kirz, J., Rudati, J., Yun, W.
Source: Journal of Synchrotron Radiation. Sep2012, Vol. 19 Issue Part 5, p751-758. 8p.
Database: Academic Search Ultimate
Description
ISSN:09090495
DOI:10.1107/S0909049512023813