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Advantages of a synchrotron bending magnet as the sample illuminator for a wide-field X-ray microscope.

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Title: Advantages of a synchrotron bending magnet as the sample illuminator for a wide-field X-ray microscope.
Authors: Feser, M., Howells, M. R., Kirz, J., Rudati, J., Yun, W.
Source: Journal of Synchrotron Radiation. Sep2012, Vol. 19 Issue Part 5, p751-758. 8p.
Database: Academic Search Ultimate
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  Data: <searchLink fieldCode="AR" term="%22Feser%2C+M%2E%22">Feser, M.</searchLink><br /><searchLink fieldCode="AR" term="%22Howells%2C+M%2E+R%2E%22">Howells, M. R.</searchLink><br /><searchLink fieldCode="AR" term="%22Kirz%2C+J%2E%22">Kirz, J.</searchLink><br /><searchLink fieldCode="AR" term="%22Rudati%2C+J%2E%22">Rudati, J.</searchLink><br /><searchLink fieldCode="AR" term="%22Yun%2C+W%2E%22">Yun, W.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Synchrotron+Radiation%22">Journal of Synchrotron Radiation</searchLink>. Sep2012, Vol. 19 Issue Part 5, p751-758. 8p.
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        Value: 10.1107/S0909049512023813
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        Text: English
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