Asymptotic Ruin Probability for a Bidimensional Delay-claim Risk Model with Dependent Subexponential Claims.

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Bibliographic Details
Title: Asymptotic Ruin Probability for a Bidimensional Delay-claim Risk Model with Dependent Subexponential Claims.
Authors: Sun, Yuchen1 (AUTHOR) sunyc21@mails.jlu.edu.cn, Lu, Dawei2 (AUTHOR) dwlu@dlut.edu.cn, Yuan, Meng3 (AUTHOR) mengyuan_prob@126.com
Source: Methodology & Computing in Applied Probability. Dec2025, Vol. 27 Issue 4, p1-23. 23p.
Database: Business Source Ultimate
Description
ISSN:13875841
DOI:10.1007/s11009-025-10224-z