Asymptotic Ruin Probability for a Bidimensional Delay-claim Risk Model with Dependent Subexponential Claims.

Saved in:
Bibliographic Details
Title: Asymptotic Ruin Probability for a Bidimensional Delay-claim Risk Model with Dependent Subexponential Claims.
Authors: Sun, Yuchen1 (AUTHOR) sunyc21@mails.jlu.edu.cn, Lu, Dawei2 (AUTHOR) dwlu@dlut.edu.cn, Yuan, Meng3 (AUTHOR) mengyuan_prob@126.com
Source: Methodology & Computing in Applied Probability. Dec2025, Vol. 27 Issue 4, p1-23. 23p.
Database: Business Source Ultimate
FullText Text:
  Availability: 0
Header DbId: bsu
DbLabel: Business Source Ultimate
An: 190682156
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Asymptotic Ruin Probability for a Bidimensional Delay-claim Risk Model with Dependent Subexponential Claims.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Sun%2C+Yuchen%22">Sun, Yuchen</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> sunyc21@mails.jlu.edu.cn</i><br /><searchLink fieldCode="AR" term="%22Lu%2C+Dawei%22">Lu, Dawei</searchLink><relatesTo>2</relatesTo> (AUTHOR)<i> dwlu@dlut.edu.cn</i><br /><searchLink fieldCode="AR" term="%22Yuan%2C+Meng%22">Yuan, Meng</searchLink><relatesTo>3</relatesTo> (AUTHOR)<i> mengyuan_prob@126.com</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Methodology+%26+Computing+in+Applied+Probability%22">Methodology & Computing in Applied Probability</searchLink>. Dec2025, Vol. 27 Issue 4, p1-23. 23p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=bsu&AN=190682156
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1007/s11009-025-10224-z
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 23
        StartPage: 1
    Titles:
      – TitleFull: Asymptotic Ruin Probability for a Bidimensional Delay-claim Risk Model with Dependent Subexponential Claims.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Sun, Yuchen
      – PersonEntity:
          Name:
            NameFull: Lu, Dawei
      – PersonEntity:
          Name:
            NameFull: Yuan, Meng
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 12
              Text: Dec2025
              Type: published
              Y: 2025
          Identifiers:
            – Type: issn-print
              Value: 13875841
          Numbering:
            – Type: volume
              Value: 27
            – Type: issue
              Value: 4
          Titles:
            – TitleFull: Methodology & Computing in Applied Probability
              Type: main
ResultId 1