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The statistical design of CCC-r chart with runs rules for a high-yield dependent process.

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Bibliographic Details
Title: The statistical design of CCC-r chart with runs rules for a high-yield dependent process.
Authors: Chen, Pei-Wen1 (AUTHOR) ieiris@saturn.yzu.edu.tw
Source: Journal of Statistical Computation & Simulation. Mar2026, Vol. 96 Issue 5, p1107-1129. 23p.
Database: Business Source Ultimate
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