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In-situ monitoring of stochastic textured surfaces with EWMA scheme using dynamic KDE-based probability limits.

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Bibliographic Details
Title: In-situ monitoring of stochastic textured surfaces with EWMA scheme using dynamic KDE-based probability limits.
Authors: Zhang, Suying1,2 (AUTHOR), Hu, Xuelong3 (AUTHOR), Castagliola, Philippe4 (AUTHOR), Wang, Jianjun1,2 (AUTHOR) jjwang@njust.edu.cn
Source: International Journal of Production Research. Apr2026, Vol. 64 Issue 8, p2880-2899. 20p.
Database: Business Source Ultimate
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Description
ISSN:00207543
DOI:10.1080/00207543.2025.2584720