APA (7th ed.) Citation

Zhang, S., Hu, X., Castagliola, P., & Wang, J. (2026). In-situ monitoring of stochastic textured surfaces with EWMA scheme using dynamic KDE-based probability limits. International Journal of Production Research, 64(8), 2880. https://doi.org/10.1080/00207543.2025.2584720

Chicago Style (17th ed.) Citation

Zhang, Suying, Xuelong Hu, Philippe Castagliola, and Jianjun Wang. "In-situ Monitoring of Stochastic Textured Surfaces with EWMA Scheme Using Dynamic KDE-based Probability Limits." International Journal of Production Research 64, no. 8 (2026): 2880. https://doi.org/10.1080/00207543.2025.2584720.

MLA (9th ed.) Citation

Zhang, Suying, et al. "In-situ Monitoring of Stochastic Textured Surfaces with EWMA Scheme Using Dynamic KDE-based Probability Limits." International Journal of Production Research, vol. 64, no. 8, 2026, p. 2880, https://doi.org/10.1080/00207543.2025.2584720.